| Spectrometers for Elemental Spectrochemical Analysis, Part II: X-Ray Fluorescence Spectrometers
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| By
Volker Thomsen
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Carlos Augusto Coutinho
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| The basic modules of spectrometer systems were discussed in Part 1 of this series, and here, the authors focus on the X-ray excitation sources.
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| DXC 2010: Going Green in the Rockies
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| By
Megan Evans
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| Spectroscopy previews the annual Denver X-Ray Conference, to be held August 2–6, 2010.
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| 2010 Pittcon Product Review: Addendum
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| Each year, the Pittcon Product Review presents many unique challenges. As the largest editorial project of the year, many hours go into ensuring that the review is as comprehensive as possible and that no stone is left unturned. Unfortunately, however, it does occasionally happen that a new product is missed, listed incorrectly, or otherwise presented erroneously. The products and companies listed here fall into one or more of these categories and it is our hope that this Addendum will present readers with a more complete picture of the spectroscopic products available at Pittcon 2010.
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| X-Ray Fluorescence and FT-IR Identification of Strontium and Carbonate in Domestic and Imported Gypsum Drywall
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| By
Jeffrey Hirsch
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Steven R. Lowry
,
Mick Dowd
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| The authors discuss the use of XRF and FT-IR for identifying contaminants in drywall.
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