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Spectroscopy




Hyphenated EGA systems
Hyphenated systems for evolved gas analysis from PerkinElmer include a system consisting of a thermogravimetric analyzer coupled with infrared spectrometers, gas chromatography–mass spectrometry systems, and mass spectrometers. The TG–IR system uses the company's FT-IR spectrometers to identify materials by their functional groups, the TG–MS system uses the company's Clarus MS system to measure the components of the gas by their mass ion, and the TG–GC–MS system provides the concentration of evolved materials and allows the detection of small amounts of material from complex matrices. PerkinElmer, Inc., Shelton, CT;
http://www.perkinelmer.com/



Inorganic standards catalog
Inorganic Ventures' 2010–2011 catalog of inorganic reference materials includes standards for ICP, ICP-MS, IC, AA, and wet chemistry applications. Standards are color-coded by application and indexed by catalog number and subject. Inorganic Ventures, Christiansburg, VA;
http://www.inorganicventures.com/



ICP check standards
The Claritas PPT ICP check standards from SPEX CertiPrep include a 55-element tuning solution for MS instruments, a mass analyzer standard containing monoisotopic elements to be used as an instrument check for any MS system, and an isotopic ratio measurement standard. The standards reportedly are supplied with a certificate of analysis that provides information about up to 68 trace impurities measured at parts-per-trillion levels. According to the company, the standards are tested under an ISO 9001:2000 quality assurance program and manufactured under a quality system complying with the requirements of ISO/IEC 17025 and ISO/IEC Guide 34-2000. SPEX CertiPrep, Inc., Metuchen, NJ;
http://www.spexcsp.com/



Photovoltaic measurement system
Newport Corporation's Oriel IQE-200 photovoltaic cell measurement system is designed for simultaneous measurement of the external and internal quantum efficiency of solar cells, detectors, and other photon-to-charge converting devices. The system reportedly splits the beam to allow for concurrent measurements. The system includes a light source, a monochromator, and related electronics and software. According to the company, the system can be used for the measurement of silicon-based cells, amorphous and mono/poly crystalline, thin-film cells, copper indium gallium diselenide, and cadmium telluride. Newport Corporation, Irvine, CA;
http://www.newport.com/IQE-200/


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